Dependencia de la emisividad con la temperatura de una superficie receptora sometida a radiación altamente concentrada

Carlos Pérez-Rábago, Lúar Moreno-Álvarez, Ricardo Pérez-Enciso, Alejandro Bautista-Orozco y Claudio Estrada

Abstract

Experimental results of the campaign to determine a method for measuring the temperature of a surface exposed to the highly concentrated radiation at HoSIERthrough three different conditions: quartz window, PYREX® window and without window are presented in this paper. It seeks to achieve a method for measuring the surface temperature without any thermocouple contact, preventing its overestimation due to the effect of the surface's radiosity itself.This methodology is able to determine a correction factor of the emissivity (FCε) depending on the incident temperature. In addition to determine the temperature difference overestimated due to the component of the radiation reflected by the surface.

Dependencia de la emisividad con la temperatura de una superficie receptora sometida a radiación altamente concentrada

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